OBSERVATION OF DIPOLAR INTERACTIONS BETWEEN PB0 DEFECTS AT THE (111) SI/SIO2 INTERFACE

Dipole-dopole (DD) interactions between Pb0 (Si?Si3) defects at the two-dimensional (2D) (111) Si/SiO2 interface are revealed by electron-spin resonance. A DD fine-structure doublet develops with increasing [Pb0] resulting in a line shape characteristic of DD interactions within a 2D dilute spin system, for which the observations are of fundamental interest. The residual line shape, devoid of DD effects, has been deduced. It is shown that a DD line broadening previously calculated for Pb0 is too small, thus questioning the assumed random-distribution model. © 1990 The American Physical Society.