STRUCTURAL STUDIES OF CHEMICALLY DEPOSITED THIN COPPER-FILMS

被引：2

作者：

CORTIJO, RO

SCHLESINGER, M

机构：

来源：

SOLID STATE COMMUNICATIONS | 1984年 / 49卷 / 03期

关键词：

D O I：

10.1016/0038-1098(84)90910-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：283 / 286

页数：4

共 10 条

[1] TIN (4) CHLORIDE SOLUTION AS A SENSITIZER IN PHOTO-SELECTIVE METAL DEPOSITION [J].

BAYLIS, BKW ;

BUSUTTIL, A ;

HEDGECOCK, NE ;

SCHLESINGER, M .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (03) :348-351

[2]

Bell R. J., 1972, INTRO FOURIER TRANSF

[3]

CORTIJO RO, J ELECTROCHEM SOC

[4]

CORTIJO RO, 1983, THESIS U WINDSOR

[5]

Dove D. B., 1973, PHYS THIN FILMS, V7, P1

[6]

GRACZYK JF, 1973, PHYS STATUS SOLIDI B, V58, P16

[7] RADIAL DENSITY FUNCTIONS FOR LIQUID MERCURY AND LEAD [J].

KAPLOW, R ;

STRONG, SL ;

AVERBACH, BL .

PHYSICAL REVIEW, 1965, 138 (5A) :1336-&

[8] NUCLEATION, GROWTH, AND STRUCTURE OF ELECTROLESS COPPER DEPOSITS [J].

SARD, R .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (07) :864-&

[9] X-ray diffraction methods [J].

Warren, BE .

JOURNAL OF APPLIED PHYSICS, 1941, 12 (05) :375-384

[10] TWINS IN ELECTROLESS COPPER-FILMS [J].

WOO, OT ;

REZEK, J ;

SCHLESINGER, M ;

CHOW, SL .

MATERIALS SCIENCE AND ENGINEERING, 1975, 17 (01) :165-168

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