IMAGING-PLATE PLANE-WAVE X-RAY TOPOGRAPHY OF LOCAL LATTICE DISTRIBUTION DUE TO GROWTH STRIATIONS IN SILICON-CRYSTALS

被引:9
作者
MAEKAWA, I [1 ]
KUDO, Y [1 ]
KOJIMA, S [1 ]
KAWADO, S [1 ]
ISHIKAWA, T [1 ]
机构
[1] UNIV TOKYO, FAC ENGN, BUNKYO KU, TOKYO 113, JAPAN
关键词
D O I
10.1063/1.109163
中图分类号
O59 [应用物理学];
学科分类号
摘要
A newly developed imaging-plate plane-wave x-ray topography (IPPWT) method has been successfully applied to the quantitative analysis of local lattice distortion due to growth striations in magnetic-field-applied Czochralski silicon single crystals. IPPWT was found to possess sufficient spatial resolution to accurately measure variations of growth-induced local lattice distortions (DELTAd/d and DELTAalpha. The advantageous features of IPPWT, in comparison with conventional photographic-plate plane-wave x-ray topography, are a wide latitude in x-ray exposure conditions, better x-ray intensity linearity for performing quantitative analysis, and convenience in image processing and data handling.
引用
收藏
页码:2980 / 2982
页数:3
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