X-RAY TOPOGRAPHY WITH HIGHLY COLLIMATED BEAM AT PHOTON FACTORY

[1] SYNCHROTRON PLANE-WAVE X-RAY TOPOGRAPHY OF GAAS WITH A SEPARATE (+, +) MONOCHRO-COLLIMATOR [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (12): : L968 - L971

[2] MEASUREMENT OF THE COHERENCE LENGTH OF HIGHLY COLLIMATED X-RAYS FROM THE VISIBILITY OF EQUAL-THICKNESS FRINGES [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 496 - 499

[3] HIGH-PRECISION GONIOMETER SYSTEM FOR TOPOGRAPHY AND DIFFRACTOMETRY USING MULTIPLE CRYSTAL ARRANGEMENT [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) : 613 - 616

[4] EQUI-LATTICE-SPACING MAPPING X-RAY TOPOGRAPHY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 : 344 - 348

[5] KAWADO S, 1989, REV SCI INS, V60

[6] KOHRA K, 1962, J PHYS SOC JPN, V29, P1322

[7] RENNINGER M, 1961, Z NATURFORSCH PT A, V16, P1110

[8] OBSERVATIONS ON EQUAL-INCLINATION INTERFERENCE FRINGES FROM A THIN CRYSTAL OF SILICON USING NEARLY PARALLEL X-RAY BEAM [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1971, 31 (04) : 1295 - +

[1] SYNCHROTRON PLANE-WAVE X-RAY TOPOGRAPHY OF GAAS WITH A SEPARATE (+, +) MONOCHRO-COLLIMATOR [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (12): : L968 - L971

[2] MEASUREMENT OF THE COHERENCE LENGTH OF HIGHLY COLLIMATED X-RAYS FROM THE VISIBILITY OF EQUAL-THICKNESS FRINGES [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 496 - 499

[3] HIGH-PRECISION GONIOMETER SYSTEM FOR TOPOGRAPHY AND DIFFRACTOMETRY USING MULTIPLE CRYSTAL ARRANGEMENT [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) : 613 - 616

[4] EQUI-LATTICE-SPACING MAPPING X-RAY TOPOGRAPHY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 : 344 - 348

[5] KAWADO S, 1989, REV SCI INS, V60

[6] KOHRA K, 1962, J PHYS SOC JPN, V29, P1322

[7] RENNINGER M, 1961, Z NATURFORSCH PT A, V16, P1110

[8] OBSERVATIONS ON EQUAL-INCLINATION INTERFERENCE FRINGES FROM A THIN CRYSTAL OF SILICON USING NEARLY PARALLEL X-RAY BEAM [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1971, 31 (04) : 1295 - +