EQUI-LATTICE-SPACING MAPPING X-RAY TOPOGRAPHY

被引：27

作者：

ISHIKAWA, T ^{[1
]}

KITANO, T ^{[1
]}

MATSUI, J ^{[1
]}

机构：

[1] NEC CORP,FUNDAMENTA RES LABS,SEMICOND RES LAB,KAWASAKI,KANAGAWA 213,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1987年 / 20卷

关键词：

D O I：

10.1107/S0021889887086503

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：344 / 348

页数：5

相关论文

共 21 条

[1] PRECISION LATTICE CONSTANT DETERMINATION
BOND, WL
[J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818
[2] BONSE U, 1961, DIRECT OBSERVATION I, P431
[3] Buschert R C, 1965, B AM PHYS SOC, V10, P125
[4] CHIKAWA J, 1986, XRAY INSTRUMENTATION, P145
[5] DOBBYN RC, 1984, APPLICATIONS XRAY TO, P241
[6] BRAGG ANGLE MEASUREMENT AND MAPPING
HART, M
[J]. JOURNAL OF CRYSTAL GROWTH, 1981, 55 (02) : 409 - 427
[7] EXPERIMENTAL AND THEORETICAL-STUDIES ON X-RAY PLANE-WAVE IMAGES OF A DISLOCATION IN THE LAUE CASE
ISHIDA, H
MIYAMOTO, N
ISHIKAWA, T
KOHRA, K
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1982, 37 (07): : 650 - 659
[8] DETERMINATION OF BURGERS VECTOR OF A DISLOCATION FROM EQUAL-THICKNESS FRINGES OBSERVED WITH A PLANE-WAVE OF X-RAYS
ISHIDA, H
MIYAMOTO, N
KOHRA, K
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (JUN1) : 240 - 241
[9] SYNCHROTRON PLANE-WAVE X-RAY TOPOGRAPHY OF GAAS WITH A SEPARATE (+, +) MONOCHRO-COLLIMATOR
ISHIKAWA, T
KITANO, T
MATSUI, J
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (12): : L968 - L971
[10] HIGH-PRECISION GONIOMETER SYSTEM FOR TOPOGRAPHY AND DIFFRACTOMETRY USING MULTIPLE CRYSTAL ARRANGEMENT
ISHIKAWA, T
MATSUI, J
KITANO, T
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) : 613 - 616