APPLICATION OF THE KUBELKA-MUNK THEORY TO THICKNESS-DEPENDENT DIFFUSE-REFLECTANCE OF BLACK PAINTS IN THE MID-IR

被引:23
作者
GUNDE, MK [1 ]
LOGAR, JK [1 ]
OREL, ZC [1 ]
OREL, B [1 ]
机构
[1] NATL INST CHEM,LJUBLJANA 61115,SLOVENIA
关键词
KUBELKA-MUNK THEORY; DIFFUSE REFLECTANCE; ABSORPTION COEFFICIENT; SCATTERING COEFFICIENT; SCATTERING PENETRATION DEPTH; BLACK PAINT;
D O I
10.1366/0003702953964165
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The Kubelka-Munk theory is applied to the thickness-dependent diffuse reflectance of black-painted samples in the mid-IR. The calculated absorption and scattering coefficients are wavenumber-dependent. The reflectance of the nonideal backing also shows spectral features, which is attributed to the reflections from the boundary surface between the scattering medium and the substrate. The spectral dependence of scattering penetration depth is caused by the scattering and absorption processes. At some wavenumbers, the diffuse reflectance is independent of layer thickness, because of particular values of the parameters of the applied theory. The application of the Kubelka-Munk function is discussed.
引用
收藏
页码:623 / 629
页数:7
相关论文
共 32 条
[22]   COMPLETE ELIMINATION OF SPECULAR REFLECTANCE IN INFRARED DIFFUSE REFLECTANCE MEASUREMENTS [J].
MESSERSCHMIDT, RG .
APPLIED SPECTROSCOPY, 1985, 39 (04) :737-739
[23]   MULTIPLE SCATTERING CALCULATIONS FOR TECHNOLOGY [J].
MUDGETT, PS ;
RICHARDS, LW .
APPLIED OPTICS, 1971, 10 (07) :1485-&
[24]   FTIR SPECTROSCOPIC INVESTIGATIONS AND THE THERMAL-STABILITY OF THICKNESS SENSITIVE SPECTRALLY SELECTIVE (TSSS) PAINT COATINGS [J].
OREL, B ;
OREL, ZC ;
KRAINER, A ;
HUTCHINS, MG .
SOLAR ENERGY MATERIALS, 1991, 22 (04) :259-279
[25]  
OREL B, 1989, SOL ENERG MATER, V18, P97
[26]   CHARACTERIZATION OF TSSS PAINT COATINGS FOR SOLAR COLLECTORS BY FTIR SPECTROSCOPY [J].
OREL, ZC ;
JERMAN, R ;
HODOSCEK, M ;
OREL, B .
SOLAR ENERGY MATERIALS, 1990, 20 (5-6) :435-454
[27]  
PARFITT GD, 1969, DISPERSION POWDERS L, P312
[28]  
PATTON TC, 1974, PAINT PAINT DISPERSI, P213
[29]   QUANTITATIVE-ANALYSIS OF POWDERY SAMPLE BY DIFFUSE REFLECTANCE INFRARED FOURIER-TRANSFORM SPECTROMETRY - DETERMINATION OF THE ALPHA-COMPONENT IN SILICON-NITRIDE [J].
TSUGE, A ;
UWAMINO, Y ;
ISHIZUKA, T ;
SUZUKI, K .
APPLIED SPECTROSCOPY, 1991, 45 (08) :1377-1380
[30]   INFRARED REFLECTANCE FROM MAT SURFACES [J].
VINCENT, RK ;
HUNT, GR .
APPLIED OPTICS, 1968, 7 (01) :53-&