MAGNETORESISTANCE IN SI METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS - EVIDENCE OF WEAK LOCALIZATION AND CORRELATION

被引：179

作者：

BISHOP, DJ

DYNES, RC

TSUI, DC

机构：

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.26.773

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：773 / 779

页数：7

共 19 条

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UREN, MJ
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[7] DOLAN GJ, 1978, PHYS REV LETT, V43, P72
[8] DYNES RC, P LT16
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