FOCUSED SLOW ION BEAM FOR STUDY OF ELECTRON EJECTION FROM SOLIDS

被引：12

作者：

HAGSTRUM, HD

PRETZER, DD

TAKEISHI, Y

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1965年 / 36卷 / 08期

关键词：

D O I：

10.1063/1.1719835

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1183 / &

共 11 条

[1]

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[9] APPARATUS FOR STUDY OF EJECTION OF AUGER ELECTRONS FROM SOLID SURFACES [J].

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