EFFECT OF MICROSTRUCTURAL CHANGES ON THERMALLY ACTIVATED FLUX-CREEP BEHAVIOR IN THE BI-SR-CA-CU-O SYSTEM

被引：13

作者：

SHI, DL

XU, M

FANG, MM

CHEN, JG

CORNELIUS, AL

LANAN, SG

机构：

[1] GEORGIA INST TECHNOL,SCH PHYS,ATLANTA,GA 30332

[2] WESTERN ILLINOIS UNIV,DEPT PHYS,MACOMB,IL 61455

[3] UNIV ILLINOIS,DEPT MAT SCI & ENGN,URBANA,IL 61801

[4] OHIO STATE UNIV,COLUMBUS,OH 43210

[5] DEVRY INST TECHNOL,CHICAGO,IL 60680

来源：

PHYSICAL REVIEW B | 1990年 / 41卷 / 13期

关键词：

D O I：

10.1103/PhysRevB.41.8833

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We measured magnetic relaxation for the zero-field-cooled magnetization of liquid-quenched Bi-Sr-Ca-Cu-O samples with various microstructures at an applied field of 1 kOe. We found that a large amount of crystal defects observed in the sample matrix greatly increase the pinning strength and, in turn, enhance the flux-creep behavior. The relaxation rate peaks at 14 K and drops to zero near 60 K. The increased activation energy in our crystallized samples is attributed to strong pinning caused by a high density of precipitates and lattice stacking faults. © 1990 The American Physical Society.

引用

页码：8833 / 8837

页数：5

共 19 条

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