ECONOMICAL ONLINE IMAGE-PROCESSING OF SYNCHROTRON X-RADIATION TOPOGRAPHS

被引：6

作者：

TANNER, BK

CLARK, GF

GODDARD, PA

BOWEN, DK

DAVIES, ST

ALESHKOOZHEVSKY, OP

机构：

[1] UNIV WARWICK,DEPT ENGN,COVENTRY CV4 7AL,W MIDLANDS,ENGLAND

[2] SRC,DARESBURY LAB,WARRINGTON WA4 4AD,LANCS,ENGLAND

[3] ACAD SCI USSR,INST CRYSTALLOG,MOSCOW V-71,USSR

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期

关键词：

Financial support from the SERC is acknowledged. The authors are extremely grateful to Micro Consultants Ltd; of Newbury; for loan of an INTELLECT 100 image processor. O.A-0. participated in this work as part of the UK/USSR co-operative agreement on synchrotron radiation research;

D O I：

10.1016/0167-5087(83)91210-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：713 / 717

页数：5

共 7 条

[1]

ALESHKOOZHEVSKY OP, UNPUB FERROELECTRICS

[2] THE X-RAY TOPOGRAPHY STATION AT DARESBURY LABORATORY [J].

BOWEN, DK ;

CLARK, GF ;

DAVIES, ST ;

NICHOLSON, JRS ;

ROBERTS, KJ ;

SHERWOOD, JN ;

TANNER, BK .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2) :277-284

[3]

Chikawa J., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P368

[4]

GREEN RE, 1971, ADV XRAY ANAL, V20, P22

[5] DIRECT SYNCHROTRON X-RAY TOPOGRAPHY OF MOVING DOMAIN-WALLS IN FE-SI SINGLE-CRYSTALS [J].

HARTMANN, W ;

HAGEN, W ;

MILTAT, J .

APPLIED PHYSICS LETTERS, 1980, 36 (06) :483-485

[6]

Hartmann W., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P497

[7]

HARTMANN W, 1977, TOP APPL PHYS, V22, P191

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