CHARGE COMPENSATION FOR IMAGING LARGE INSULATING SAMPLES BY USING SECONDARY-ION TANDEM MASS-SPECTROMETRY

被引：13

作者：

SHORT, RT ^{[1
]}

MCMAHON, JM ^{[1
]}

HOLLAND, WM ^{[1
]}

TODD, PJ ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37831

来源：

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY | 1994年 / 5卷 / 01期

基金：

美国国家卫生研究院;

关键词：

D O I：

10.1016/1044-0305(94)85082-8

中图分类号：

Q5 [生物化学];

学科分类号：

071010 ; 081704 ;

摘要：

A charge compensation technique has been developed for secondary ion mass spectrometry and imaging of insulating samples as large as 1 cm(2) using a triple quadrupole-based microprobe. The microprobe secondary ion extraction field is synchronized with a periodic primary Cs+ beam to allow a sheetlike beam of 5-eV electrons to pass over the sample surface when the extraction field is zeroed. Electrons are attracted to, and neutralize, any points on the sample that have accumulated positive charge. Positive secondary ion images from Teflon(R), a well-known insulator, illustrate the effectiveness of charge compensation. Locating and identifying analytes on dry filter paper by using tandem mass spectrometry are also demonstrated.

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页码：37 / 43

页数：7

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