ASSESSMENT OF BAND OFFSETS IN SI/SIGE STRAINED LAYER SUPERLATTICES BY VERTICAL TRANSPORT MEASUREMENTS

被引：4

作者：

JORKE, H

HERZOG, HJ

KASPER, E

KIBBEL, H

机构：

[1] AEG Research Cent Ulm, Ulm, West Ger, AEG Research Cent Ulm, Ulm, West Ger

来源：

JOURNAL OF CRYSTAL GROWTH | 1987年 / 81卷 / 1-4期

关键词：

ing us with I—V characteristics. One of the authors (H.J.) is indebted to H. Risken and H.D. Voilmer for valuable discussions. Th. Ricker is acknowledged for carefully reading the manuscript. This work was partly supported by the Bundesminis-terium für Forschung und Technologie;

D O I：

10.1016/0022-0248(87)90430-1

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：440 / 444

页数：5