STRESS MEASUREMENTS DURING OXIDATION OF TANTALUM AND NIOBIUM

[1] EPITAXIALLY INDUCED STRAINS IN CU2O FILMS ON COPPER SINGLE CRYSTALS .1. X-RAY DIFFRACTION EFFECTS [J]. ACTA METALLURGICA, 1962, 10 (AUG): : 691 - &

[2] EPITAXIALLY INDUCED STRAINS IN CU2O FILMS ON COPPER SINGLE CRYSTALS .2. OPTICAL EFFECTS [J]. ACTA METALLURGICA, 1962, 10 (AUG): : 699 - &

[3] THE MICROTOPOGRAPHY OF OXIDE FILMS ON NIOBIUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (08) : 442 - 446

[4] DANKOV PD, 1950, DOKL AKAD NAUK SSSR, V73, P1221

[5] ESHELBY JD, 1956, SOLID STATE PHYSICS, V3, P112

[6] GEBHARDT E, 1959, Z METALLKD, V50, P521

[7] GEBHARDT E, 1963, Z METALLKD, V54, P623

[8] HAMPEL CA, 1961, RARE METALS HDB, pCH25

[9] MECHANICAL STRESSES DURING THE OXIDATION OF COPPER AND THEIR INFLUENCE ON OXIDATION KINETICS .3. [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (09) : 1031 - 1037

[10] JAENICKE W, 1958, Z PHYS CHEM, V15, P175

[1] EPITAXIALLY INDUCED STRAINS IN CU2O FILMS ON COPPER SINGLE CRYSTALS .1. X-RAY DIFFRACTION EFFECTS [J]. ACTA METALLURGICA, 1962, 10 (AUG): : 691 - &

[2] EPITAXIALLY INDUCED STRAINS IN CU2O FILMS ON COPPER SINGLE CRYSTALS .2. OPTICAL EFFECTS [J]. ACTA METALLURGICA, 1962, 10 (AUG): : 699 - &

[3] THE MICROTOPOGRAPHY OF OXIDE FILMS ON NIOBIUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (08) : 442 - 446

[4] DANKOV PD, 1950, DOKL AKAD NAUK SSSR, V73, P1221

[5] ESHELBY JD, 1956, SOLID STATE PHYSICS, V3, P112

[6] GEBHARDT E, 1959, Z METALLKD, V50, P521

[7] GEBHARDT E, 1963, Z METALLKD, V54, P623

[8] HAMPEL CA, 1961, RARE METALS HDB, pCH25

[9] MECHANICAL STRESSES DURING THE OXIDATION OF COPPER AND THEIR INFLUENCE ON OXIDATION KINETICS .3. [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (09) : 1031 - 1037

[10] JAENICKE W, 1958, Z PHYS CHEM, V15, P175