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EPITAXIALLY INDUCED STRAINS IN CU2O FILMS ON COPPER SINGLE CRYSTALS .1. X-RAY DIFFRACTION EFFECTS

被引：91
作者：
BORIE, B
SPARKS, CJ
CATHCART, JV
机构：
来源：
ACTA METALLURGICA | 1962年 / 10卷 / AUG期
关键词：
D O I：
10.1016/0001-6160(62)90038-X
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
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页码：691 / &
相关论文
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[2]   DETERMINATION OF THIN OXIDE FILM THICKNESS BY INTEGRATED INTENSITY MEASUREMENTS [J].
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SPARKS, CJ .
ACTA CRYSTALLOGRAPHICA, 1961, 14 (06) :569-&
[3]   EPITAXIALLY INDUCED STRAINS IN CU2O FILMS ON COPPER SINGLE CRYSTALS .2. OPTICAL EFFECTS [J].
CATHCART, JV ;
EPPERSON, JE ;
PETERSEN, GF .
ACTA METALLURGICA, 1962, 10 (AUG) :699-&
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