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MODULATION OF RENNINGER SCAN INTENSITY - A NEW X-RAY TECHNIQUE TO CHARACTERIZE EPITAXIAL STRUCTURES

被引：5
作者：
GREENBERG, B
LADELL, J
机构：
来源：
APPLIED PHYSICS LETTERS | 1987年 / 50卷 / 08期
关键词：
D O I：
10.1063/1.98166
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：436 / 438
页数：3
相关论文
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