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FABRICATION AND JOSEPHSON PROPERTIES OF NB3GE
被引:12
作者
:
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,8803 RUSCHLIKON,SWITZERLAND
LAIBOWITZ, RB
TSUEI, CC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,8803 RUSCHLIKON,SWITZERLAND
TSUEI, CC
CUOMO, JC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,8803 RUSCHLIKON,SWITZERLAND
CUOMO, JC
ZIEGLER, JF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,8803 RUSCHLIKON,SWITZERLAND
ZIEGLER, JF
HATZAKIS, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,8803 RUSCHLIKON,SWITZERLAND
HATZAKIS, M
机构
:
[1]
IBM CORP,ZURICH RES LAB,8803 RUSCHLIKON,SWITZERLAND
[2]
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
:
IEEE TRANSACTIONS ON MAGNETICS
|
1975年
/ MA11卷
/ 02期
关键词
:
D O I
:
10.1109/TMAG.1975.1058625
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:883 / 884
页数:2
相关论文
共 9 条
[1]
RADIO-FREQUENCY EFFECTS IN SUPERCONDUCTING THIN FILM BRIDGES
ANDERSON, PW
论文数:
0
引用数:
0
h-index:
0
ANDERSON, PW
DAYEM, AH
论文数:
0
引用数:
0
h-index:
0
DAYEM, AH
[J].
PHYSICAL REVIEW LETTERS,
1964,
13
(06)
: 195
-
&
[2]
SUPERCONDUCTIVITY IN NB-GE FILMS ABOVE 22 K
GAVALER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,RES LABS,PITTSBURGH,PA 15235
WESTINGHOUSE ELECT CORP,RES LABS,PITTSBURGH,PA 15235
GAVALER, JR
[J].
APPLIED PHYSICS LETTERS,
1973,
23
(08)
: 480
-
482
[3]
HATZAKIS M, 1971, 11TH S EL ION LAS BE, P337
[4]
PENETRATION DEPTH AS UPPER SIZE LIMIT FOR TYPE II SUPERCONDUCTOR JOSEPHSON JUNCTIONS
JANOCKO, MA
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
JANOCKO, MA
ASHKIN, M
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
ASHKIN, M
JONES, CK
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
JONES, CK
[J].
PHYSICS LETTERS A,
1973,
A 43
(04)
: 345
-
346
[5]
PROPERTIES OF NB JOSEPHSON MICROBRIDGES
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
LAIBOWITZ, RB
[J].
APPLIED PHYSICS LETTERS,
1973,
23
(07)
: 407
-
408
[6]
LAIBOWITZ RB, UNPUBLISHED RESULTS
[7]
LIKHAREV KK, 1972, JETP, V34, P906
[8]
ELECTRON BEAM FABRICATION OF MICRON TRANSISTORS
MAGDO, S
论文数:
0
引用数:
0
h-index:
0
MAGDO, S
HATZAKIS, M
论文数:
0
引用数:
0
h-index:
0
HATZAKIS, M
TING, CH
论文数:
0
引用数:
0
h-index:
0
TING, CH
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1971,
15
(06)
: 446
-
&
[9]
ELECTRICAL CHARACTERISTICS OF RF-SPUTTERED SINGLE-CRYSTAL NIOBIUM FILMS
MAYADAS, AF
论文数:
0
引用数:
0
h-index:
0
MAYADAS, AF
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
LAIBOWITZ, RB
CUOMO, JJ
论文数:
0
引用数:
0
h-index:
0
CUOMO, JJ
[J].
JOURNAL OF APPLIED PHYSICS,
1972,
43
(03)
: 1287
-
+
←
1
→
共 9 条
[1]
RADIO-FREQUENCY EFFECTS IN SUPERCONDUCTING THIN FILM BRIDGES
ANDERSON, PW
论文数:
0
引用数:
0
h-index:
0
ANDERSON, PW
DAYEM, AH
论文数:
0
引用数:
0
h-index:
0
DAYEM, AH
[J].
PHYSICAL REVIEW LETTERS,
1964,
13
(06)
: 195
-
&
[2]
SUPERCONDUCTIVITY IN NB-GE FILMS ABOVE 22 K
GAVALER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,RES LABS,PITTSBURGH,PA 15235
WESTINGHOUSE ELECT CORP,RES LABS,PITTSBURGH,PA 15235
GAVALER, JR
[J].
APPLIED PHYSICS LETTERS,
1973,
23
(08)
: 480
-
482
[3]
HATZAKIS M, 1971, 11TH S EL ION LAS BE, P337
[4]
PENETRATION DEPTH AS UPPER SIZE LIMIT FOR TYPE II SUPERCONDUCTOR JOSEPHSON JUNCTIONS
JANOCKO, MA
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
JANOCKO, MA
ASHKIN, M
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
ASHKIN, M
JONES, CK
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
WESTINGHOUSE CORP,RES LABS,PITTSBURG,PA 15235
JONES, CK
[J].
PHYSICS LETTERS A,
1973,
A 43
(04)
: 345
-
346
[5]
PROPERTIES OF NB JOSEPHSON MICROBRIDGES
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
LAIBOWITZ, RB
[J].
APPLIED PHYSICS LETTERS,
1973,
23
(07)
: 407
-
408
[6]
LAIBOWITZ RB, UNPUBLISHED RESULTS
[7]
LIKHAREV KK, 1972, JETP, V34, P906
[8]
ELECTRON BEAM FABRICATION OF MICRON TRANSISTORS
MAGDO, S
论文数:
0
引用数:
0
h-index:
0
MAGDO, S
HATZAKIS, M
论文数:
0
引用数:
0
h-index:
0
HATZAKIS, M
TING, CH
论文数:
0
引用数:
0
h-index:
0
TING, CH
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1971,
15
(06)
: 446
-
&
[9]
ELECTRICAL CHARACTERISTICS OF RF-SPUTTERED SINGLE-CRYSTAL NIOBIUM FILMS
MAYADAS, AF
论文数:
0
引用数:
0
h-index:
0
MAYADAS, AF
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
LAIBOWITZ, RB
CUOMO, JJ
论文数:
0
引用数:
0
h-index:
0
CUOMO, JJ
[J].
JOURNAL OF APPLIED PHYSICS,
1972,
43
(03)
: 1287
-
+
←
1
→