INSITU OBSERVATION OF MICROPARTICLES IN A VACUUM-INSULATED GAP USING A SCANNING ELECTRON-MICROSCOPE

被引：10

作者：

THEOPHILUS, GD ^{[1
]}

SRIVASTAVA, KD ^{[1
]}

VANHEESWIJK, RG ^{[1
]}

机构：

[1] UNIV WATERLOO,WATERLOO,ONTARIO,CANADA

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 03期

关键词：

D O I：

10.1063/1.322677

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：897 / 898

页数：2

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[3] CHAKRABARTI AK, 1974, 6 P INT S DISCH EL I, P16
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[5] DETECTION AND IDENTIFICATION OF MICROPARTICLES OCCURRING IN A HIGH-VOLTAGE VACUUM-INSULATED GAP USING ELECTRON-OPTICAL METHODS
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[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (05) : 2094 - 2098
[6] COMPARATIVE INVESTIGATIONS OF DC AND 60HZ PREBREAKDOWN BEHAVIOR OF VACUUM INSULATION
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[J]. IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1975, 94 (05): : 1859 - 1867