PULSED-LASER FLUOROPHORE DEPOSITION - A METHOD FOR MEASURING THE AXIAL RESOLUTION IN 2-PHOTON FLUORESCENCE MICROSCOPY

被引：6

作者：

HELL, SW ^{[1
]}

UTZ, AR ^{[1
]}

SCHRADER, M ^{[1
]}

HANNINEN, PE ^{[1
]}

SOINI, E ^{[1
]}

机构：

[1] CTR BIOTECHNOL,SF-20521 TURKU,FINLAND

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1995年 / 12卷 / 09期

关键词：

4Pi confocal microscopy; Axial resolution; Two-photon fluorescence microscopy;

D O I：

10.1364/JOSAA.12.002072

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report the generation of thin (< 50 nm) fluorescence layers on a glass substrate in the focal region of a high-numerical-aperture lens by employing subpicosecond pulses of 0.75-TW/cm(2) peak intensity. The conditions for generating the fluorescence layers are described. We find that the fluorescence molecules at the glass interface are less affected by bleaching than those in the surrounding area. The fluorescence layers are suited for measuring and monitoring the axial resolution of two-photon fluorescence microscopes.

引用

页码：2072 / 2076

页数：5

共 13 条

[1] 2-PHOTON LASER SCANNING FLUORESCENCE MICROSCOPY [J].