NANOMETER CHARACTERIZATION OF SINGLE-POINT DIAMOND-TURNED MIRRORS ON THE MICROMETER AND SUBMICROMETER SCALE

被引:3
作者
YU, J
HOU, L
MA, WS
CAO, JL
YU, JY
YAO, JE
机构
[1] ACAD SINICA,BEIJING LAB ELECTRON MICROSCOPY,BEIJING 100080,PEOPLES R CHINA
[2] JILIN UNIV TECHNOL,CHANGCHUN 130025,PEOPLES R CHINA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期
关键词
D O I
10.1116/1.587650
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single point diamond turning (SPDT) is one of the nanometer machining methods. We deal with the nanometer characterization of diamond-turned mirrors on the micrometer and submicrometer scale with our three-dimensional roughness measuring system based on scanning tunneling microscopy. We have studied the results of amplitude spectral density functions for these surfaces. Finally, we have calculated the total integrated scattering as a function of incident light wavelength lambda and root mean square surface roughness sigma and the diffracted angle theta(d) as a function of the lambda and the surface spatial wavelength lambda(sp). All these measurement results are the basis for improving the SPDT surface quality.
引用
收藏
页码:1835 / 1838
页数:4
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