EVIDENCE OF AN ENERGETIC ION-BOMBARDMENT MECHANISM FOR BIAS-ENHANCED NUCLEATION OF DIAMOND

被引:71
作者
MCGINNIS, SP
KELLY, MA
HAGSTROM, SB
机构
[1] Department of Materials Science and Engineering, Stanford University, Stanford
关键词
D O I
10.1063/1.113621
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of substrate bias voltage was investigated for bias-enhanced diamond nucleation pretreatments of diamond thin films in a microwave plasma chemical vapor deposition reactor. A critical bias voltage of approximately -200 V was observed for nucleation density enhancement from ∼10 4cm-2to∼1010cm-2. Furthermore, the nucleation density under bias conditions was five orders of magnitude lower for a small silicon region electrically isolated from the otherwise negatively biased silicon substrate. These results confirm that bombardment of the substrate by energetic cations plays a significant role in the diamond nucleation mechanism during bias pretreatments.© 1995 American Institute of Physics.
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页码:3117 / 3119
页数:3
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