DEPTH PROFILING OF HYDROGEN IN THIN-FILMS WITH THE ELASTIC RECOIL DETECTION TECHNIQUE

被引：15

作者：

CHENG, HS

ZHOU, ZY

YANG, FC

XU, ZW

REN, YH

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91051-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：601 / 606

页数：6

共 8 条

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[8] PROFILING HYDROGEN IN MATERIALS USING ION-BEAMS [J].

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WU, CP ;

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SCHULTE, RL ;

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MAGEE, CW ;

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LECUYER, J ;

LANFORD, WA ;

KUEHNE, FJ ;

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HOFER, WO ;

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EVANS, CA ;

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ALLRED, DD .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :19-39

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