PARTICULARITIES OF CRYSTALLINE TO AMORPHOUS STATE CONVERSION IN SILICON HEAVILY DAMAGED BY 140 KEV SI++ IONS

被引：12

作者：

GOLANSKI, A

FIDERKIEWICZ, A

RZEWUSKI, H

LEFELDSOSNOWSKA, M

GRONKOWSKI, J

GROTZSCHEL, R

KREISSIG, U

BARTSCH, H

机构：

[1] INST NUCL RES,PL-05400 SWIERK,POLAND

[2] UNIV WARSAW,INST EXPTL PHYS,PL-02089 WARSAW,POLAND

[3] DAWB,ZENT INST KERN FORSCH,ROSSENDORF,DEUTSCH DEM REP

[4] DAWB,INST FESTKORPER PHYS & ELEKTRONENMIKROSKOPIE,DDR-401 HALLE,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1976年 / 38卷 / 01期

关键词：

D O I：

10.1002/pssa.2210380116

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：139 / 149

页数：11

共 17 条

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