INSITU STUDIES OF EPITAXIAL-GROWTH IN THE LOW-ENERGY ELECTRON-MICROSCOPE

被引:47
作者
MUNDSCHAU, M [1 ]
BAUER, E [1 ]
TELIEPS, W [1 ]
SWIECH, W [1 ]
机构
[1] WROCLAW B BEIRUT UNIV,INST EXPTL PHYS,PL-50205 WROCLAW,POLAND
关键词
D O I
10.1016/0039-6028(89)90298-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:381 / 392
页数:12
相关论文
共 15 条
[1]   THE RESOLUTION OF THE LOW-ENERGY ELECTRON REFLECTION MICROSCOPE [J].
BAUER, E .
ULTRAMICROSCOPY, 1985, 17 (01) :51-56
[2]  
BAUER E, P EUROPEAN C ELECTRO
[3]  
BAUER E, 1988, SURFACE INTERFACE CH
[4]  
BAUER E, 1987, SCANNING MICROSCOP S, V1, P99
[5]  
BAUER E, 1986, 11TH P INT C EL MICR, P67
[6]  
MUNDSCHAU M, IN PRESS PHIL MAG A
[7]  
MUNDSCHAU M, IN PRESS J APPL PHYS
[8]  
TELIEPS W, 1987, OPTIK, V77, P93
[9]   AN ANALYTICAL REFLECTION AND EMISSION UHV SURFACE ELECTRON-MICROSCOPE [J].
TELIEPS, W ;
BAUER, E .
ULTRAMICROSCOPY, 1985, 17 (01) :57-65
[10]   SURFACE IMAGING WITH LEEM [J].
TELIEPS, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 44 (01) :55-61