共 8 条
- [1] Kratky O, 1930, Z KRISTALLOGR, V72, P529
- [2] AN X-RAY CAMERA FOR MEASURING PREFERRED ORIENTATION IN WIRES [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1953, 30 (07): : 244 - 245
- [3] PEISER HS, 1955, XRAY DIFFRACTION POL, P148
- [4] CRYSTALLOGRAPHIC ASPECTS OF THIN PTSI FILMS ON SI SUBSTRATES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (APR1): : 275 - 280
- [5] X-RAY POWDER CAMERA ATTACHMENT FOR PREFERRED ORIENTATION INVESTIGATIONS [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (10): : 649 - &
- [7] WALLACE CA, TO BE PUBLISHED
- [8] AN X-RAY GONIOMETER FOR THE STUDY OF PREFERRED ORIENTATION IN POLYCRYSTALLINE AGGREGATES [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (04): : 129 - 134