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INTEGRATED DIRECTION-SENSITIVE FLOWMETER
被引:12
作者
:
VANRIET, RWM
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,DEPT ELECT ENGN,ELECTR INSTR,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,DEPT ELECT ENGN,ELECTR INSTR,DELFT,NETHERLANDS
VANRIET, RWM
[
1
]
HUIJSING, JH
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,DEPT ELECT ENGN,ELECTR INSTR,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,DEPT ELECT ENGN,ELECTR INSTR,DELFT,NETHERLANDS
HUIJSING, JH
[
1
]
机构
:
[1]
DELFT UNIV TECHNOL,DEPT ELECT ENGN,ELECTR INSTR,DELFT,NETHERLANDS
来源
:
ELECTRONICS LETTERS
|
1976年
/ 12卷
/ 24期
关键词
:
D O I
:
10.1049/el:19760497
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:647 / 648
页数:2
相关论文
共 3 条
[1]
KREITH F, 1973, PRINCIPLES HEAT TRAN, P341
[2]
MIDDELHOEK S, 1975, MIKRONIEK, V15, P87
[3]
INTEGRATED SILICON ANEMOMETER
VANPUTTE.AF
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
VANPUTTE.AF
MIDDELHOEK, S
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
MIDDELHOEK, S
[J].
ELECTRONICS LETTERS,
1974,
10
(21)
: 425
-
426
←
1
→
共 3 条
[1]
KREITH F, 1973, PRINCIPLES HEAT TRAN, P341
[2]
MIDDELHOEK S, 1975, MIKRONIEK, V15, P87
[3]
INTEGRATED SILICON ANEMOMETER
VANPUTTE.AF
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
VANPUTTE.AF
MIDDELHOEK, S
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
MIDDELHOEK, S
[J].
ELECTRONICS LETTERS,
1974,
10
(21)
: 425
-
426
←
1
→