CONSTANT CAPACITANCE DLTS CIRCUIT FOR MEASURING HIGH-PURITY SEMICONDUCTORS

被引：14

作者：

DEJULE, RY

HAASE, MA

RUBY, DS

STILLMAN, GE

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

[2] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801

来源：

SOLID-STATE ELECTRONICS | 1985年 / 28卷 / 06期

关键词：

D O I：

10.1016/0038-1101(85)90136-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：639 / 641

页数：3

相关论文

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