ACTIVATION ANALYTICAL METHODS FOR GRADING OF SEMICONDUCTOR CRYSTALS

[1] BOGANCS J, 1967, MAGY KEM FOLY, V73, P346

[2] STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (08) : 862 - +

[3] CALI JP, 1964, TRACE ANALYSIS SEMIC

[4] DECORTE F, 1971, J RADIOANAL CHEM, V8, P287

[5] DECORTE F, 1971, J RADIOANAL CHEM, V9, P9

[6] DECORTE F, 1971, J RADIOANAL CHEM, V8, P227

[7] FAUST JW, 1970, NBS337, P436

[8] GEBAUHR W, 1964, Z ANAL CHEM, V200, P266

[9] ACTIVATION ANALYSIS OF SILICON BY CONVENTION CARRIER SEPARATIONS AND BY COMPUTER REDUCTION OF GAMMA SPECTRA [J]. ANALYTICAL CHEMISTRY, 1966, 38 (13) : 1853 - &

[10] KANE PF, 1970, CHARACTERIZATION SEM

[1] BOGANCS J, 1967, MAGY KEM FOLY, V73, P346

[2] STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (08) : 862 - +

[3] CALI JP, 1964, TRACE ANALYSIS SEMIC

[4] DECORTE F, 1971, J RADIOANAL CHEM, V8, P287

[5] DECORTE F, 1971, J RADIOANAL CHEM, V9, P9

[6] DECORTE F, 1971, J RADIOANAL CHEM, V8, P227

[7] FAUST JW, 1970, NBS337, P436

[8] GEBAUHR W, 1964, Z ANAL CHEM, V200, P266

[9] ACTIVATION ANALYSIS OF SILICON BY CONVENTION CARRIER SEPARATIONS AND BY COMPUTER REDUCTION OF GAMMA SPECTRA [J]. ANALYTICAL CHEMISTRY, 1966, 38 (13) : 1853 - &

[10] KANE PF, 1970, CHARACTERIZATION SEM