MODEL CALCULATIONS ON INFLUENCE OF DANGLING BONDS ON OPTICAL-PROPERTIES OF AMORPHOUS SILICON FILMS

被引:5
作者
SCHWIDEFSKY, F [1 ]
机构
[1] SIEMENS AG,FORSCH LAB,MUNICH,FED REP GER
关键词
D O I
10.1016/0040-6090(75)90088-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
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页码:233 / 244
页数:12
相关论文
共 67 条
[31]   NEW INSIGHT INTO OPTICAL PROPERTIES OF AMORPHOUS GE AND SI [J].
JOANNOPO.JD ;
COHEN, ML .
SOLID STATE COMMUNICATIONS, 1973, 13 (08) :1115-1118
[32]   ELECTRONIC-STRUCTURE OF CRYSTALLINE POLYTYPES AND AMORPHOUS SI [J].
JOANNOPOULOS, JD ;
COHEN, ML .
PHYSICS LETTERS A, 1972, A 41 (01) :71-+
[33]   STRUCTURE OF CHEMICALLY DEPOSITED POLYCRYSTALLINE-SILICON FILMS [J].
KAMINS, TI ;
CASS, TR .
THIN SOLID FILMS, 1973, 16 (02) :147-165
[34]   ELECTRONIC STRUCTURE AND OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM AND SILICON [J].
KRAMER, B .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 47 (02) :501-&
[35]   A PSEUDOPOTENTIAL APPROACH FOR GREENS FUNCTION OF ELECTRONS IN AMORPOUS SOLIDS [J].
KRAMER, B .
PHYSICA STATUS SOLIDI, 1970, 41 (02) :649-&
[36]  
KRAMER B, 1972, FESTKORPERPROBLEME, V12, P133
[37]  
Kramer B., 1972, J NON-CRYST SOLIDS, V8, P659
[38]   OPTICAL INVESTIGATION OF DIFFERENT SILICON FILMS [J].
KUHL, C ;
SCHLOTTERER, H ;
SCHWIDEFSKY, F .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (11) :1496-1500
[39]  
KUHL C, 1973, SEP C OPT PROP THIN, P29