X-RAY MICRODIFFRACTOMETER USING SYNCHROTRON RADIATION

An x-ray diffractometer using synchrotron radiation (SR) has been constructed and its performance was evaluated. Its characteristics are (1) a fine and highly intense x-ray beam from focusing SR x rays on a sample using two spherical mirrors which are arranged in the Kirkpatrick-Baez configuration and (2) a high detection efficiency of the cylindrical bent imaging plate (IP). A focused beam size of 10 X 11 mum2 and intensity of more than 10(7) photons/s were obtained at a wavelength of 1.38 angstrom. Accuracy of the lattice parameters, deltaa/a, was 2 X 10(-4) estimated from measuring a superconductor YBa2Cu3O7-delta powder. The developed microdiffractometer was applied to measure diffraction images from a specific region on the NbTi metal superconducting wire which consisted of many NbTi fine wires buried in a Cu matrix. Diffraction peaks from a NbTi fine wire of 30 mum diameter were clearly observed and were distinct from the Cu matrix. The developed microdiffractometer can be applied to measurements of as-received samples in the micro-order specific region.