POLARIZED ANGULAR-DISTRIBUTIONS OF PARAMETRIC X-RADIATION AND VACUUM-ULTRAVIOLET TRANSITION RADIATION FROM RELATIVISTIC ELECTRONS

被引：24

作者：

FIORITO, RB

RULE, DW

PIESTRUP, MA

MARUYAMA, XK

SILZER, RM

SKOPIK, DM

SHCHAGIN, AV

机构：

[1] ADELPHI TECHNOL INC, PALO ALTO, CA 94301 USA

[2] USN, POSTGRAD SCH, MONTEREY, CA 93943 USA

[3] UNIV SASKATCHEWAN, SASKATCHEWAN ACCELERATOR LAB, SASKATOON, SK S7N 0W0, CANADA

[4] KHARKOV PHYS & TECHNOL INST, KHARKOV 310108, UKRAINE

来源：

PHYSICAL REVIEW E | 1995年 / 51卷 / 04期

关键词：

D O I：

10.1103/PhysRevE.51.R2759

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

We present quantifiable images of the angular distributions (AD's) of parametric x radiation (PXR), and vacuum-ultraviolet transition radiation (vuv TR) from 230 MeV electrons interacting with a silicon crystal. Both AD's are highly polarized. The vuv TR and optical TR data provide measurements of the beam energy and effective divergence angle. Using these quantities and separately known values of the electronic susceptibility χ0, we show that the measured PXR AD is in good agreement with the predictions of single crystal theory. Our analysis suggests a method to measure χ0 using PXR AD's. © 1995 The American Physical Society.

引用

页码：R2759 / R2762

页数：4