SOLID FABRY-PEROT ETALONS FOR X-RAYS

被引：27

作者：

BARBEE, T ^{[1
]}

UNDERWOOD, JH ^{[1
]}

机构：

[1] UNIV CALIF LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94550

来源：

OPTICS COMMUNICATIONS | 1983年 / 48卷 / 03期

关键词：

D O I：

10.1016/0030-4018(83)90077-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：161 / 166

页数：6

共 21 条

[1]

[Anonymous], AIP C P

[2]

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[3]

Barbee Jr. T.W., 1981, AIP C P, V75, P131

[4]

Beckman P., 1963, SCATTERING ELECTROMA

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BONSE, U ;

HART, M .

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[6] AN X-RAY INTERFEROMETER WITH LONG SEPARATED INTERFERING BEAM PATHS (E) [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 7 (04) :99-&

[7] PRECISE INTERFEROMETRIC MEASUREMENT OF NI K-EDGE FORWARD SCATTERING-AMPLITUDE WITH SYNCHROTRON X-RAYS [J].

BONSE, U ;

MATERLIK, G .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1976, 24 (02) :189-191

[8] COMBINED LAUE- AND BRAGG-CASE X-RAY INTERFEROMETERS [J].

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HART, M .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :240-&

[9] DEFOCUSSED X-RAY INTERFEROMETER [J].

BONSE, U ;

TEKAAT, E .

ZEITSCHRIFT FUR PHYSIK, 1971, 243 (01) :14-+

[10] AN X-RAY INTERFEROMETER [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&

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