USE OF SPATIALLY DEPENDENT ELECTRON-CAPTURE TO PROFILE DEEP-LEVEL DENSITIES IN SCHOTTKY BARRIERS

被引：6

作者：

GOMBIA, E ^{[1
]}

GHEZZI, C ^{[1
]}

MOSCA, R ^{[1
]}

机构：

[1] UNIV PARMA, DEPARTIMENTO FIS, I-43100 PARMA, ITALY

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 58卷 / 03期

关键词：

D O I：

10.1063/1.336096

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1285 / 1291

页数：7

共 9 条

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