AIRBAG APPLICATION - A MICROSYSTEM INCLUDING A SILICON CAPACITIVE ACCELEROMETER, CMOS SWITCHED-CAPACITOR ELECTRONICS AND TRUE SELF-TEST CAPABILITY

被引:114
作者
ZIMMERMANN, L
EBERSOHL, JP
LEHUNG, F
BERRY, JP
BAILLIEU, F
REY, P
DIEM, B
RENARD, S
CAILLAT, P
机构
[1] CNRS, LAAS, F-31077 TOULOUSE, FRANCE
[2] ESIEE, F-93162 NOISY LE GRAND, FRANCE
[3] SCMM, DOPT, LETI, F-38041 GRENOBLE, FRANCE
[4] DMEL, LETI, F-38041 GRENOBLE, FRANCE
关键词
AIRBAGS; ACCELEROMETERS; CMOS; SILICON;
D O I
10.1016/0924-4247(94)00888-O
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A low cost, high reliability accelerometer microsystem designed for crash sensing in automotive airbag electronic control units is presented. The proposed microsystem offers high level output, on-line self-test function, small size (3.5 mm x 3.5 mm x 1.15 mm), and high design flexibility thanks to a two-chip construction. The sensitive part is a surface micromachined capacitive interdigitated structure realized from a SIMOX SOI substrate. The accelerometer operates in a closed loop mode using electrostatic feedback with conditioning circuitry realized in a 2 mu m CMOS process. A high performance readout circuit using switched capacitors has been developed. Behavioural simulation results show a bandwidth of 630 Hz at +/- 50g with 5 V power supply. The fabrication process includes the realization of a free-standing seismic mass by means of reactive ion etching and sacrificial oxide etching, the mechanical protection of the sensing element with a thin silicon cap bonded onto the structured SOI wafer, and eventually the electrical connection with the ASIC by flip-chip bonding. Preliminary results are very encouraging: dynamic actuation of the sensing elements is optically tested, with a yield of 70% at a prototype level. Excellent shock resistance and low internal stress are observed.
引用
收藏
页码:190 / 195
页数:6
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