MEASUREMENT OF HIGH REFLECTANCES BY USE OF MULTI-PATHS OPTICAL CAVITY

被引:1
作者
CAHUZAC, P [1 ]
GOLMAN, G [1 ]
机构
[1] CNRS,FAC SCI,AIME COTTON LAB,F-75005 PARIS,FRANCE
来源
NOUVELLE REVUE D OPTIQUE | 1976年 / 7卷 / 06期
关键词
D O I
10.1088/0335-7368/7/6/302
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:363 / 367
页数:5
相关论文
共 11 条
  • [1] AVDEENKO AA, 1964, OPT SPECTROSC, V26, P388
  • [2] A SENSITIVE SINGLE BEAM DEVICE FOR CONTINUOUS REFLECTANCE OR TRANSMITTANCE MEASUREMENTS
    BEAGLEHO.D
    [J]. APPLIED OPTICS, 1968, 7 (11): : 2218 - &
  • [3] MEASUREMENT OF HYPERFINE-STRUCTURE OF INFRARED TRANSITION OF BARIUM (I) IN SATURATED ABSORPTION
    CAHUZAC, P
    [J]. PHYSICA, 1973, 67 (03): : 567 - 584
  • [4] LETALON DE FABRY-PEROT SPHERIQUE
    CONNES, P
    [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1958, 19 (03): : 262 - 269
  • [5] DEBEAUMONT M, 1973, THESIS ORSAY
  • [6] GIACOMO P, 1952, CR HEBD ACAD SCI, V235, P1627
  • [7] HEITMANN W, 1965, Z ANGEW PHYSIK, V19, P392
  • [8] OFF-AXIS PATHS IN SPHERICAL MIRROR INTERFEROMETERS
    HERRIOTT, D
    KOMPFNER, R
    KOGELNIK, H
    [J]. APPLIED OPTICS, 1964, 3 (04): : 523 - &
  • [9] FOLDED OPTICAL DELAY LINES
    HERRIOTT, DR
    SCHULTE, HJ
    [J]. APPLIED OPTICS, 1965, 4 (08): : 883 - &
  • [10] Peek Th. H., 1970, Optics Communications, V1, P341, DOI 10.1016/0030-4018(70)90036-2