ELLIPSOMETRIC INVESTIGATION OF CORROSION OF DEPOSITED THIN MOLYBDENUM FILM

[1] THE OPTICAL CONSTANTS OF THIN METALLIC FILMS DEPOSITED BY EVAPORATION [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394): : 774 - 781

[2] Heavens O. S., 1955, OPTICAL PROPERTIES T

[3] Killeffer D. H., 1952, MOLYBDENUM COMPOUNDS

[4] INTERPRETATION OF ELLIPSOMETRIC OBSERVATIONS OF ABSORBED OXYGEN IN NIOBIUM [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (12) : 1697 - +

[5] CORROSION AND PASSIVATION OF THIN MOLYBDENUM FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (03) : 443 - &

[6] MARTON JP, 1972, J APPL PHYS, V43, P1685

[7] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +

[8] POURBAIX M, 1966, ATLAS ELECTROCHEMICA, P273

[9] Tomashov N.D., 1966, THEORY CORROSION PRO, P367

[1] THE OPTICAL CONSTANTS OF THIN METALLIC FILMS DEPOSITED BY EVAPORATION [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394): : 774 - 781

[2] Heavens O. S., 1955, OPTICAL PROPERTIES T

[3] Killeffer D. H., 1952, MOLYBDENUM COMPOUNDS

[4] INTERPRETATION OF ELLIPSOMETRIC OBSERVATIONS OF ABSORBED OXYGEN IN NIOBIUM [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (12) : 1697 - +

[5] CORROSION AND PASSIVATION OF THIN MOLYBDENUM FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (03) : 443 - &

[6] MARTON JP, 1972, J APPL PHYS, V43, P1685

[7] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +

[8] POURBAIX M, 1966, ATLAS ELECTROCHEMICA, P273

[9] Tomashov N.D., 1966, THEORY CORROSION PRO, P367