OPTIMUM SIMPLE STEP-STRESS PLANS FOR ACCELERATED LIFE TESTING

被引：232

作者：

MILLER, R ^{[1
]}

NELSON, W ^{[1
]}

机构：

[1] GE,CRD,SCHENECTADY,NY 12345

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1983年 / 32卷 / 01期

关键词：

D O I：

10.1109/TR.1983.5221475

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：59 / 65

页数：7

共 18 条

[1]

ALLEN WR, 1965, COMMUNICATION

[2] OPTIMAL ACCELERATED LIFE DESIGNS FOR ESTIMATION [J].

CHERNOFF, H .

TECHNOMETRICS, 1962, 4 (03) :381-&

[3]

FEIGL P, 1965, BIOMETRICS, V21, P826, DOI 10.2307/2528247

[4] COMPARISON OF METHODS FOR ANALYZING CENSORED LIFE DATA TO ESTIMATE RELATIONSHIPS BETWEEN STRESS AND PRODUCT LIFE [J].

HAHN, GJ ;

NELSON, W .

IEEE TRANSACTIONS ON RELIABILITY, 1974, R 23 (01) :2-11

[5] ASYMPTOTIC PROPERTIES OF MAXIMUM LIKELIHOOD ESTIMATIONS FOR INDEPENDENT NOT IDENTICALLY DISTRIBUTED CASE [J].

HOADLEY, B .

ANNALS OF MATHEMATICAL STATISTICS, 1971, 42 (06) :1977-&

[6]

MANN NR, 1974, METHODS STATISTICAL

[7] OPTIMUM ACCELERATED LIFE-TESTS FOR WEIBULL AND EXTREME VALUE DISTRIBUTIONS [J].

MEEKER, WQ ;

NELSON, W .

IEEE TRANSACTIONS ON RELIABILITY, 1975, 24 (05) :321-332

[8]

MILLER R, 1979, TIS79CRD262 GEN EL R

[9] GRAPHICAL ANALYSIS OF ACCELERATED LIFE TEST DATA WITH INVERSE POWER LAW MODEL [J].

NELSON, W .

IEEE TRANSACTIONS ON RELIABILITY, 1972, R 21 (01) :2-&

[10] THEORY FOR OPTIMUM ACCELERATED CENSORED LIFE TESTS FOR WEIBULL AND EXTREME VALUE DISTRIBUTIONS [J].

NELSON, W ;

MEEKER, WQ .

TECHNOMETRICS, 1978, 20 (02) :171-177

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