ASPECTS OF SILICATE SURFACE AND BULK STRUCTURE-ANALYSIS USING X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS)

被引：36

作者：

HOCHELLA, MF ^{[1
]}

BROWN, GE ^{[1
]}

机构：

[1] STANFORD UNIV,CTR MAT RES,STANFORD,CA 94305

来源：

GEOCHIMICA ET COSMOCHIMICA ACTA | 1988年 / 52卷 / 06期

关键词：

D O I：

10.1016/0016-7037(88)90232-3

中图分类号：

P3 [地球物理学]; P59 [地球化学];

学科分类号：

0708 ; 070902 ;

摘要：

引用

页码：1641 / 1648

页数：8

共 55 条

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