XPS MEASUREMENTS AND STRUCTURAL ASPECTS OF SILICATE AND PHOSPHATE-GLASSES

被引：197

作者：

BRUCKNER, R

CHUN, HU

GORETZKI, H

SAMMET, M

机构：

[1] PERKIN ELMER PHYS ELECTR,MUNCHEN,FED REP GER

[2] UNIV FRANKFURT,INST PHYS CHEM,D-6000 FRANKFURT 70,FED REP GER

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1980年 / 42卷 / 1-3期

关键词：

D O I：

10.1016/0022-3093(80)90007-1

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：49 / 60

页数：12

相关论文

共 10 条

[1] ELECTRONIC-STRUCTURE OF ALUMINUM-OXIDE AS DETERMINED BY X-RAY PHOTOEMISSION
BALZAROTTI, A
BIANCONI, A
[J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1976, 76 (02): : 689 - 694
[2] BRUCKNER R, 1978, JPN J APPL PHYS, V17, P291
[3] Goretzki, 1976, GLASTECH BER, V49, P211
[4] Goretzki, 1978, GLASTECH BER, V51, P1
[5] X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES
GRESCH, R
MULLERWARMUTH, W
DUTZ, H
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (01) : 127 - 136
[6] CHEMICAL-SHIFTS OF ESCA AND AUGER LINES IN COBALT OXIDES
HABER, J
UNGIER, L
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 12 (03) : 305 - 312
[7] Hunold K., 1980, GLASTECH BER-GLASS, V53, P149
[8] X-RAY PHOTOEMISSION STUDY OF A SODA-LIME-SILICA GLASS
NAGEL, SR
TAUC, J
BAGLEY, BG
[J]. SOLID STATE COMMUNICATIONS, 1976, 20 (03) : 245 - 249
[9] X-RAY SPECTROSCOPIC INVESTIGATION OF STRUCTURE OF SILICA, SILICATES AND OXIDES IN CRYSTALLINE AND VITREOUS STATE
WIECH, G
ZOPF, E
CHUN, HU
BRUCKNER, R
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1976, 21 (02) : 251 - 261
[10] CORE BINDING ENERGY DIFFERENCE BETWEEN BRIDGING AND NONBRIDGING OXYGEN ATOMS IN A SILICATE CHAIN
YIN, LI
GHOSE, S
ADLER, I
[J]. SCIENCE, 1971, 173 (3997) : 633 - &