INFRARED PROPERTIES AND MORPHOLOGY OF THF4 FILMS

被引：5

作者：

MAR, HYB

BERNALG, E

机构：

[1] HONEYWELL INC,SYST & RES CTR,2600 RIDGWAY PKWY,MINNEAPOLIS,MN 55413

[2] HONEYWELL CORP RES CTR,10701 LYNDALE AVE S,BLOOMINGTON,MN 55420

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1975年 / 12卷 / 04期

关键词：

D O I：

10.1116/1.568701

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：919 / 924

页数：6

共 8 条

[1]

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[2] HEAT-FLOW ANALYSIS OF LASER ABSORPTION CALORIMETRY [J].

BERNALG, E .

APPLIED OPTICS, 1975, 14 (02) :314-321

[3]

Chopra K.L, 1969, THIN FILM PHENOMENA

HEITMANN, W ;

RITTER, E .

APPLIED OPTICS, 1968, 7 (02) :307-&

[5]

KLEIN MV, 1960, OPTICS

[6] THE FAR INFRARED REFLECTIVITY OF NACL, KCL AND KBR CRYSTALS [J].

MITSUISHI, A ;

YOSHINAGA, H ;

FUJITA, S .

[7] LOW-LOSS MULTILAYER DIELECTRIC MIRRORS [J].

PERRY, DL .

APPLIED OPTICS, 1965, 4 (08) :987-&

[8] OPTICAL COATINGS FOR HIGH-ENERGY ZNSE LASER WINDOWS [J].

RUDISILL, JE ;

BRAUNSTEIN, M ;

BRAUNSTEIN, AI .