SURFACE ANALYSIS WITH HEAVY-ION INDUCED AUGER ELECTRONS - BASIC PROPERTIES OF A NEW METHOD FOR MATERIALS SCIENCES

被引：7

作者：

GROENEVELD, KO ^{[1
]}

MANN, R ^{[1
]}

MECKBACH, W ^{[1
]}

SPOHR, R ^{[1
]}

机构：

[1] UNIV FRANKFURT,INST KERN PHYS,FRANKFURT,FED REP GER

来源：

VACUUM | 1975年 / 25卷 / 01期

关键词：

D O I：

10.1016/0042-207X(75)91058-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：9 / 12

页数：4

共 12 条

[1]

BRANDT W, 1973, 3 P INT C AT PHYS BO

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GROENEVELD, KO .

NUCLEAR INSTRUMENTS & METHODS, 1972, 105 (03) :467-+

[5] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].

FOLKMANN, F ;

GAARDE, C ;

HUUS, T ;

KEMP, K .

NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499

[6] X-RAY PRODUCTION BY ALPHA-PARTICLE IMPACT [J].

GARCIA, JD .

PHYSICAL REVIEW A-GENERAL PHYSICS, 1971, 4 (03) :955-&

[7]

GROENEVELD KO, 1973, GSI7311 GES SCHWER

[8]

GROENEVELD KO, TO BE PUBLISHED

[9]

MUSKET RG, 1972, APPL PHYS LETT, V20, P1

[10] CROSS SECTIONS FOR AR L-SHELL X-RAY EMISSION IN COLLISIONS OF HE+, C+, N+, O+, AL+, CL+, TI+, FE+, CU+ ON AR [J].

SARIS, FW .

PHYSICA, 1971, 52 (02) :290-&

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