SURFACE-COMPOSITION OF ALPHA-CU-AL ALLOYS

被引:16
作者
BAIRD, RJ
POTTER, TJ
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期
关键词
D O I
10.1116/1.572781
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
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页码:1371 / 1373
页数:3
相关论文
共 15 条
[1]   ANGLE-RESOLVED PHOTOEMISSION-STUDY OF (100), (110), AND (111) SURFACES OF CU0.9A10.1 - BULK AND SURFACE ELECTRONIC-STRUCTURE OF THE ALLOY [J].
ASONEN, H ;
LINDROOS, M ;
PESSA, M ;
PRASAD, R ;
RAO, RS ;
BANSIL, A .
PHYSICAL REVIEW B, 1982, 25 (12) :7075-7085
[2]  
BAIRD R, UNPUB
[3]   ELECTRON-SPECTROSCOPY OF SINGLE-CRYSTAL, ALPHA-PHASE CU-AL ALLOYS [J].
BAIRD, RJ ;
EBERHARDT, W .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02) :538-540
[4]  
BAIRD RJ, 1984, B AM PHYS SOC, V29, P268
[5]   MEASUREMENT OF EQUILIBRIUM SURFACE SEGREGATION USING AUGER ELECTRON SPECTROSCOPY [J].
BONZEL, HP ;
AARON, HB .
SCRIPTA METALLURGICA, 1971, 5 (12) :1057-&
[6]   SHORT-RANGE STRUCTURE OF COPPER-16 AT PERCENT ALUMINUM [J].
BORIE, B ;
SPARKS, CJ .
ACTA CRYSTALLOGRAPHICA, 1964, 17 (07) :827-&
[7]   SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS ;
BAIRD, RJ ;
SIEKHAUS, W ;
NOVAKOV, T ;
BERGSTROM, SA .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137
[8]   MEASUREMENT OF EQUILIBRIUM SURFACE SEGREGATION USING AUGER ELECTRON SPECTROSCOPY - REPLY [J].
FERRANTE, J .
SCRIPTA METALLURGICA, 1971, 5 (12) :1129-&
[9]   AUGER ELECTRON SPECTROSCOPY AND LEED STUDY OF EQUILIBRIUM SURFACE SEGREGATION IN COPPER-ALUMINUM ALLOYS [J].
FERRANTE, J .
ACTA METALLURGICA, 1971, 19 (08) :743-&
[10]   CHEMICAL EFFECT IN (LVV) AUGER-SPECTRA OF 3RD-PERIOD ELEMENTS (AL, SI, P, AND S) DISSOLVED IN COPPER [J].
HIRAKI, A ;
KIM, S ;
KAMMURA, W ;
IWAMI, M .
APPLIED PHYSICS LETTERS, 1979, 34 (03) :194-195