SUPPRESSION OF INTERFERENCE-FRINGES IN ABSORPTION-MEASUREMENTS ON THIN-FILMS

被引：95

作者：

RITTER, D ^{[1
]}

WEISER, K ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,DEPT ELECT ENGN,IL-32000 HAIFA,ISRAEL

来源：

OPTICS COMMUNICATIONS | 1986年 / 57卷 / 05期

关键词：

D O I：

10.1016/0030-4018(86)90270-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：336 / 338

页数：3

共 8 条

[1]

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[3]

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[4] DETERMINATION OF LOW ABSORPTION-COEFFICIENTS FROM ABSORPTANCE MEASUREMENTS ON THIN-FILMS [J].

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THEYE, ML .

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[5]

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[6] ENERGY-DEPENDENCE OF THE CARRIER MOBILITY-LIFETIME PRODUCT IN HYDROGENATED AMORPHOUS-SILICON [J].

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AMER, NM .

PHYSICAL REVIEW B, 1983, 27 (08) :4861-4871

[7]

Moss T. S., 1973, SEMICONDUCTOR OPTOEL, P19

[8] GAP STATES DENSITY IN A-SI-H DEDUCED FROM SUBGAP OPTICAL-ABSORPTION MEASUREMENT ON SCHOTTKY SOLAR-CELLS [J].

VANECEK, M ;

ABRAHAM, A ;

STIKA, O ;

STUCHLIK, J ;

KOCKA, J .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 83 (02) :617-623

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