X-RAY OBSERVATIONS OF DEFECT STRUCTURES IN SILICON CRYSTALS

被引：18

作者：

SUGITA, Y

机构：

来源：

关键词：

D O I：

10.1143/JJAP.4.962

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：962 / &

共 28 条

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[7]

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[10]

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