IMAGING NANOMETER-SIZE METALLIC CLUSTERS WITH THE ATOMIC-FORCE MICROSCOPE

被引：12

作者：

SCHAEFER, DM ^{[1
]}

RAMACHANDRA, A ^{[1
]}

ANDRES, RP ^{[1
]}

REIFENBERGER, R ^{[1
]}

机构：

[1] PURDUE UNIV, SCH CHEM ENGN, W LAFAYETTE, IN 47907 USA

来源：

ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS | 1993年 / 26卷 / 1-4期

关键词：

D O I：

10.1007/BF01429159

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

The atomic force microscope has been used in the attractive (non-contact) force mode to produce images of individual nanometer-size clusters pre-formed in the gas phase and deposited on a wide variety of atomically-flat substrates. Using this technique, it is now possible to reliably image pre-formed clusters in their as-deposited positions. Studies of nanometer-size Au clusters supported on highly oriented pyrolitic graphite clearly show how the clusters are distributed across the scanned region. Cluster coverages inferred from atomic force studies are compared to those obtained from TEM studies of amorphous carbon grids simultaneously exposed to the same cluster beam.

引用

页码：249 / 251

页数：3

共 16 条

[11]

LIN ME, 1992, IN PRESS PHYS REV B

[12] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J].

MARTIN, Y ;

WILLIAMS, CC ;

WICKRAMASINGHE, HK .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) :4723-4729

[13]

MCCLELLAND GM, 1987, REV PROGR QUANTITA B, V6, P1307

[14] NOVEL OPTICAL APPROACH TO ATOMIC FORCE MICROSCOPY [J].

MEYER, G ;

AMER, NM .

APPLIED PHYSICS LETTERS, 1988, 53 (12) :1045-1047

[15]

Schaefer D. W., UNPUB

[16]

Ziegler J. F, 1977, HELIUM STOPPING POWE

← 1 2 →