ELEMENTAL DEPTH PROFILE ANALYSIS OF HARD COATINGS OF TUNGSTEN CARBIDE BY AUGER-ELECTRON (AES-) MICROPROBE SPUTTERING

被引：3

作者：

GARTEN, RPH

机构：

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1986年 / 324卷 / 02期

关键词：

D O I：

10.1007/BF00473349

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：111 / 119

页数：9

共 78 条

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