ON THE ABOVE SUPPLY VOLTAGE HOT-CARRIER DISTRIBUTION IN SEMICONDUCTOR-DEVICES

被引:8
作者
LEUNG, CCC
CHILDS, PA
机构
[1] School of Electronic and Electrical Engineering, University of Birmingham, Birmingham B15 2TT
关键词
D O I
10.1063/1.113550
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter we show that contrary to recent suggestions the hot carrier distribution at energies greater than the maximum available from the electric fields within a device does not take the form exp(-ε/kTL), where TL is the lattice temperature. The effective temperature is shown to be typically 1.35TL close to the supply energy, only approaching TL at energies well above that available from the electric field. Our results are obtained by solving the one-dimensional Boltzmann transport equation using a novel hybrid Monte Carlo/iterative technique. © 1995 American Institute of Physics.
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页码:162 / 164
页数:3
相关论文
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SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (3B) :B590-B592
[3]   SPATIALLY TRANSIENT HOT-ELECTRON DISTRIBUTIONS IN SILICON DETERMINED FROM THE CHAMBERS PATH-INTEGRAL SOLUTION OF THE BOLTZMANN TRANSPORT-EQUATION [J].
LEUNG, CCC ;
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