ON THE DETERMINATION OF THE NATURE OF MISFIT DISLOCATIONS IN SEMICONDUCTOR STRAINED-LAYER HETEROSTRUCTURES

被引:10
作者
HERBEAUX, C
DIPERSIO, J
LEFEBVRE, A
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D O I
10.1080/09500838908206350
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:243 / 248
页数:6
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