SURFACE PROFILE MEASUREMENTS - SURVEY OF APPLICATIONS IN AREA OF VACUUM DEPOSITION

被引:9
作者
BREITWEI.G [1 ]
机构
[1] SLOAN TECHNOL CORP, SANTA BARBARA, CA 93102 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1974年 / 11卷 / 01期
关键词
D O I
10.1116/1.1318536
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:101 / 105
页数:5
相关论文
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ANDERSON, RM ;
NEUDECK, GW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (02) :454-&
[2]  
CAMPBELL DS, 1961, 7 NAT S VAC T, P313
[3]  
KOENIG JH, 1967, MATER RES B, V2, P509
[4]  
LEWIS W, 1950, THIN FILMS SURFACES
[5]  
SCHWARTZ N, 1962, 8 T NAT VAC S, P836