INFLUENCE OF THE GENERATION DISTRIBUTION ON THE CALCULATED EBIC CONTRAST OF LINE DEFECTS

被引：22

作者：

DONOLATO, C

VENTURI, P

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 73卷 / 02期

关键词：

D O I：

10.1002/pssa.2210730211

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：377 / 387

页数：11

共 26 条

[1] ON THE ANALYSIS OF EBIC CONTRAST OF CRYSTAL DEFECTS [J].

BEER, M ;

MENNIGER, H ;

RAIDT, H ;

ROHRBECK, W .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1980, 61 (02) :365-372

[2]

BRESSE JF, 1972, SCANNING ELECTRON MI, P105

[3] ON THE EBIC CONTRAST OF DISLOCATIONS IN SI [J].

CASTELLANI, L ;

GONDI, P ;

PATUELLI, C ;

BERTI, R .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 69 (02) :677-685

[4] SPATIAL DISTRIBUTION OF FLUORESCENT RADIATION EMISSION CAUSED BY AN ELECTRON BEAM [J].

COHN, A ;

CALEDONIA, G .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (09) :3767-+

[5] COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS [J].

DONOLATO, C ;

KLANN, H .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (03) :1624-1633

[6]

DONOLATO C, 1978, OPTIK, V52, P19

[7] CORRECTION [J].

DONOLATO, C .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (10) :5573-5573

[8] AN ANALYTICAL MODEL OF SEM AND STEM CHARGE COLLECTION IMAGES OF DISLOCATIONS IN THIN SEMICONDUCTOR LAYERS .1. MINORITY-CARRIER GENERATION, DIFFUSION, AND COLLECTION [J].

DONOLATO, C .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 65 (02) :649-658

[9] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J].

EVERHART, TE ;

HOFF, PH .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5837-&

[10] ELECTRON PENETRATION AND ENERGY-TRANSFER IN SOLID TARGETS [J].

FITTING, HJ ;

GLAEFEKE, H ;

WILD, W .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 43 (01) :185-190

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