LATERAL THERMAL-DIFFUSIVITY OF EPITAXIAL DIAMOND FILMS

被引:35
作者
KADING, OW [1 ]
ROSLER, M [1 ]
ZACHAI, R [1 ]
FUSSER, HJ [1 ]
MATTHIAS, E [1 ]
机构
[1] FREE UNIV BERLIN,D-14195 BERLIN,GERMANY
关键词
D O I
10.1016/0925-9635(94)90165-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Highly oriented heteroepitaxial diamond films grown on silicon (001) substrates were investigated by photothermal displacement spectroscopy at transient thermal gratings. Lateral thermal diffusivities were measured as a function of the height within the 90 mum thick films. A strong diffusivity variation was observed from less than 1 cm2 s-1 near the substrate interface up to 10 cm2 s-1 in the top growth region, which is about 80% of that for single-crystal type IIa diamond. The results are compared with those obtained from fibre-textured diamond films. The structural properties are characterized using micro-Raman spectroscopy.
引用
收藏
页码:1178 / 1182
页数:5
相关论文
共 3 条
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